Advanced IC Testing
ALTER TECHNOLOGY US provides advanced electrical test solutions for complex and emerging semiconductor technologies, supporting the full product lifecycle from development to production for high-reliability (Hi-REL) applications.
Advanced IC Testing services include:
- NRE, test development, and electrical characterization of advanced semiconductor devices
- Design-aware test development, leveraging EDA environments to:
- Automatically generate test patterns from design and vector simulations
- Correlate silicon measurements with design intent
- Replay ATE results back into simulation tools for debug and yield learning
- Electrical characterization over extended voltage, frequency, and temperature ranges
- Use of latest-generation Automated Test Equipment (ATE), such as Advantest EXA Scale testers, enabling high-speed, high-pin-count, mixed-signal, RF, and power testing
Advanced IC Testing commonly supports devices such as:
- System-in-Package (SiP)
- Chiplets and heterogeneous multi-die architectures
- ASICs and custom SoCs
- FPGAs and VLSI devices
- Advanced mixed-signal, RF, and power ICs
These services are designed for mission-critical electronics used in defense, aerospace, medical, nuclear, and oil & gas environments.
Velocity REPLAY Callout
Design-to-Tester Correlation with Velocity REPLAY
For complex devices and advanced test programs, Alter Technology US can leverage Velocity REPLAY workflows to accelerate test development and improve correlation between EDA simulation vectors and ATE execution. This enables faster debug, stronger confidence in expected responses, and streamlined bring-up for advanced ICs.
- EDA → ATE pattern generation: convert design verification vectors into tester-ready patterns
- ATE → simulation replay: bring measured tester results back into the simulation environment for correlation
- Faster debug cycles: reduce iteration time between design, test program, and silicon behavior
Compact Workflow: EDA → ATE Pattern Generation → Simulation Replay
Compact closed-loop flow showing EDA-driven pattern generation and tester-to-simulation replay.
